한국 테스트산업 발전을 위한 산학협동 방안 2013. 06. 19 전 홍신 hongshin.jun@sk.com
Test Strategy, Test Modes 테스트의 가치 Test Challenges : Design Complexity, High Performance, Low Power, Thermal : Test Cost Pressure : New Technology (FinFET, 3D, Flexible Display, Small Footprint) : Short Market Window : High Quality Requirements 테스트+ Test Strategy, Test Modes Test Cost Early Validation TTM FA, Root Cause Quality Protocol Aware Test Infra 테스트+ DFT 테스트+ DFD 테스트+ DFM 테스트+ 설계
산학 협동의 선순환 산업체 학교 1. 테스트+ ROI 2. 선행연구투자 테스트+ 인재 Project 산학협동 Project 1. 연구업적 2. 논문실적 1. Wafer
SK hynix is expending its business scope : DRAM, FLASH, NGM : SSD : WIO-DRAM, HBM, 2.5D/3D : SiP, SOC Test Challenges-Opportunities are there 테스트+ 인재 1. Wafer